• 简体中文
  • 繁体中文
  • English
Home>Products>Optical Lenses>Customize/Special/Accessories > Differential Interference Contrast (DIC)
Differential Interference Contrast (DIC)

Differential Interference Contrast (DIC)

Suitable for detecting samples with extremely small height differences, including metallographic structures, minerals, magnetic head grinding surfaces, hard disk surfaces, and wafer grinding surfaces.

Contact Downloads

Features

    Without considering the blockage of the annulus and condenser annulus, high numerical aperture objective observation can be achieved, improving axial resolution.
    The relative hierarchical relationship between the various components of the observed sample is prominent, presenting a relief or three-dimensional image.
Features
Product Parameters
FollowUs
咨询热线
0512-36869502
©2009-2023 Mvotem Optics 版权所有    Technical support:YIMEINET   Registration number：苏ICP备12057878号